Durán Chacón JA, García Luna FJ. Vision system for detecting defects in electronic circuit boards. Mem. Científ. Tecnol. [Internet]. 2026 Mar. 11 [cited 2026 Nov. 14];5(1):10-1. Available from: https://erevistas.uacj.mx/ojs/index.php/memoriascyt/article/view/7604